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An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM) (2018)

First Author: Safaie H

Attributed to: Advanced Materials equipment refresh funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927618002490

Publication URI: http://dx.doi.org/10.1017/s1431927618002490

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S1