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Ion-beam-induced bending of semiconductor nanowires. (2018)

First Author: Hanif I

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/aac659

PubMed Identifier: 29781443

Publication URI: http://europepmc.org/abstract/MED/29781443

Type: Journal Article/Review

Volume: 29

Parent Publication: Nanotechnology

Issue: 33

ISSN: 0957-4484