In situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply (2014)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4883766
Publication URI: http://dx.doi.org/10.1063/1.4883766
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 22