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An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO 2 (2012)

First Author: Donnelly S

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/371/1/012045

Publication URI: http://dx.doi.org/10.1088/1742-6596/371/1/012045

Type: Journal Article/Review

Parent Publication: Journal of Physics: Conference Series