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Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano- to the micro-scale (2018)

First Author: Wight N

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.matpr.2017.12.267

Publication URI: http://dx.doi.org/10.1016/j.matpr.2017.12.267

Type: Journal Article/Review

Parent Publication: Materials Today: Proceedings

Issue: 4