Reducing the complexity of near-field scanning of stochastic fields (2017)
Attributed to:
Characterising electromagnetic fields of integrated electronic systems in enclosures - a ray-wave approach
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/telsks.2017.8246218
Publication URI: http://dx.doi.org/10.1109/telsks.2017.8246218
Type: Conference/Paper/Proceeding/Abstract