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Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate (2018)

First Author: Benoit M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/13/12/p12009

Publication URI: http://dx.doi.org/10.1088/1748-0221/13/12/p12009

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 12