Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate (2018)
Attributed to:
Development of HV-CMOS sensor technology for future tracking applications
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/13/12/P12009
Publication URI: http://dx.doi.org/10.1088/1748-0221/13/12/P12009
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 12