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Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation (2018)

First Author: Anders J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/13/10/p10004

Publication URI: http://dx.doi.org/10.1088/1748-0221/13/10/p10004

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 10