📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation (2018)

First Author: Anders J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/13/10/p10004

Publication URI: http://dx.doi.org/10.1088/1748-0221/13/10/p10004

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 10