Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure (2016)
Attributed to:
Skyrmionics: From Magnetic Excitations to Functioning Low-Energy Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.94.174107
Publication URI: http://dx.doi.org/10.1103/physrevb.94.174107
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 17
ISSN: 2469-9950