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Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope (2019)

First Author: MacLaren I

Attributed to: Fast Pixel Detectors: a paradigm shift in STEM imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927618016239

PubMed Identifier: 30696493

Publication URI: http://europepmc.org/abstract/MED/30696493

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: 1

ISSN: 1431-9276