Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope. (2019)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927618016239
PubMed Identifier: 30696493
Publication URI: http://europepmc.org/abstract/MED/30696493
Type: Journal Article/Review
Volume: 25
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Issue: 1
ISSN: 1431-9276