A Bayesian framework to estimate part quality and associated uncertainties in multistage manufacturing (2019)

First Author: Papananias M

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.compind.2018.10.008

Publication URI: http://dx.doi.org/10.1016/j.compind.2018.10.008

Type: Journal Article/Review

Parent Publication: Computers in Industry