Critical assessment 31: on the modelling of tertiary creep in single-crystal superalloys (2018)
Attributed to:
Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1080/02670836.2018.1528733
Publication URI: http://dx.doi.org/10.1080/02670836.2018.1528733
Type: Journal Article/Review
Parent Publication: Materials Science and Technology
Issue: 18
ISSN: 0267-0836