Lifetime Enhancement of 4H-SiC PiN Diodes Using High Temperature Oxidation Treatment (2018)

First Author: Bonyadi Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/MSF.924.440

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/MSF.924.440

Type: Journal Article/Review

Parent Publication: Materials Science Forum

ISSN: 02555476