'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups (2018)
Attributed to:
High-Speed AFM
funded by
NERC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6501/aad771
Publication URI: http://dx.doi.org/10.1088/1361-6501/aad771
Type: Journal Article/Review
Parent Publication: Measurement Science and Technology
Issue: 10