Transient and Steady-State Thermal Measurements of GaN-on-SiC HEMT Transistors Under Realistic Microwave Drive (2019)
Attributed to:
University of Surrey- Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/arftg.2019.8637241
Publication URI: http://dx.doi.org/10.1109/arftg.2019.8637241
Type: Conference/Paper/Proceeding/Abstract