Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM (2019)
Attributed to:
EPSRC Manufacturing Fellowship in Gallium Nitride
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5082846
Publication URI: http://dx.doi.org/10.1063/1.5082846
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 10