Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM (2019)

First Author: Lee L
Attributed to:  Vertical cubic GaN LEDs on 150mm 3C-SiC substrates funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5082846

Publication URI: http://dx.doi.org/10.1063/1.5082846

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 10