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A Dual-Point Technique for the Entire I D -V G Characterization Into Subthreshold Region Under Random Telegraph Noise Condition (2019)

First Author: Zhan X

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2019.2903516

Publication URI: http://dx.doi.org/10.1109/led.2019.2903516

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 5