Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag La and Al Ka sources (2019)
Attributed to:
University of Nottingham - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6647
Publication URI: http://dx.doi.org/10.1002/sia.6647
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 7