Detecting nanometric displacements with optical ruler metrology. (2019)
Attributed to:
National Hub in High Value Photonic Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1126/science.aaw7840
PubMed Identifier: 31072905
Publication URI: http://europepmc.org/abstract/MED/31072905
Type: Journal Article/Review
Volume: 364
Parent Publication: Science (New York, N.Y.)
Issue: 6442
ISSN: 0036-8075