Iodine-Ethanol Surface Passivation for Measurement of Millisecond Carrier Lifetimes in Silicon Wafers with Different Crystallographic Orientations (2019)

First Author: Al-Amin M
Attributed to:  SuperSilicon PV: extending the limits of material performance funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssa.201900257

Publication URI: http://dx.doi.org/10.1002/pssa.201900257

Type: Journal Article/Review

Parent Publication: physica status solidi (a)

Issue: 17