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Iodine-Ethanol Surface Passivation for Measurement of Millisecond Carrier Lifetimes in Silicon Wafers with Different Crystallographic Orientations (2019)

First Author: Al-Amin M

Attributed to: Gettering of impurities in silicon: delivering quantitative understanding to improve photovoltaics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssa.201900257

Publication URI: http://dx.doi.org/10.1002/pssa.201900257

Type: Journal Article/Review

Parent Publication: physica status solidi (a)

Issue: 17