Iodine-Ethanol Surface Passivation for Measurement of Millisecond Carrier Lifetimes in Silicon Wafers with Different Crystallographic Orientations (2019)
Attributed to:
Gettering of impurities in silicon: delivering quantitative understanding to improve photovoltaics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssa.201900257
Publication URI: http://dx.doi.org/10.1002/pssa.201900257
Type: Journal Article/Review
Parent Publication: physica status solidi (a)
Issue: 17