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Increasing throughput in x-ray computed tomography measurement of surface topography using sinogram interpolation (2019)

First Author: Körner L

Attributed to: Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6501/ab37e5

Publication URI: http://dx.doi.org/10.1088/1361-6501/ab37e5

Type: Journal Article/Review

Parent Publication: Measurement Science and Technology

Issue: 12