Increasing throughput in x-ray computed tomography measurement of surface topography using sinogram interpolation (2019)
Attributed to:
Metrology for precision and additive manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6501/ab37e5
Publication URI: http://dx.doi.org/10.1088/1361-6501/ab37e5
Type: Journal Article/Review
Parent Publication: Measurement Science and Technology
Issue: 12