Novel Tunnel-Contact-Controlled IGZO Thin-Film Transistors with High Tolerance to Geometrical Variability. (2019)

First Author: Sporea RA
Attributed to:  Design for high-yield manufacturing of printed circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/adma.201902551

PubMed Identifier: 31309623

Publication URI: http://europepmc.org/abstract/MED/31309623

Type: Journal Article/Review

Volume: 31

Parent Publication: Advanced materials (Deerfield Beach, Fla.)

Issue: 36

ISSN: 0935-9648