InGaAs avalanche photodiode thermometry (2020)
Attributed to:
Optimised manufacturing through unique innovations in Quantitative Thermal Imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6501/ab41c6
Publication URI: http://dx.doi.org/10.1088/1361-6501/ab41c6
Type: Journal Article/Review
Parent Publication: Measurement Science and Technology
Issue: 1