Machine Learning Approach for Predicting the Effect of Statistical Variability in Si Junctionless Nanowire Transistors (2019)
Attributed to:
Quantum Electronics Device Modelling (QUANTDEVMOD)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/led.2019.2931839
Publication URI: http://dx.doi.org/10.1109/led.2019.2931839
Type: Journal Article/Review
Parent Publication: IEEE Electron Device Letters
Issue: 9