Machine Learning Approach for Predicting the Effect of Statistical Variability in Si Junctionless Nanowire Transistors (2019)

First Author: Carrillo-Nunez H
Attributed to:  Quantum Electronics Device Modelling (QUANTDEVMOD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2019.2931839

Publication URI: http://dx.doi.org/10.1109/led.2019.2931839

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 9