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Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy. (2019)

First Author: Van Aert S

Attributed to: Fast Pixel Detectors: a paradigm shift in STEM imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.122.066101

PubMed Identifier: 30822049

Publication URI: http://europepmc.org/abstract/MED/30822049

Type: Journal Article/Review

Volume: 122

Parent Publication: Physical review letters

Issue: 6

ISSN: 0031-9007