Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy. (2019)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.122.066101
PubMed Identifier: 30822049
Publication URI: http://europepmc.org/abstract/MED/30822049
Type: Journal Article/Review
Volume: 122
Parent Publication: Physical review letters
Issue: 6
ISSN: 0031-9007