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Improving the Consistency of Nanoscale Etching for Atomic Force Microscopy Tomography Applications (2019)

First Author: Buckwell M

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3389/fmats.2019.00203

Publication URI: http://dx.doi.org/10.3389/fmats.2019.00203

Type: Journal Article/Review

Parent Publication: Frontiers in Materials