X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement (2019)
Attributed to:
Development and Application of Non-Equilibrium Doping in Amorphous Chalcogenides
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s10854-019-01212-4
Publication URI: http://dx.doi.org/10.1007/s10854-019-01212-4
Type: Journal Article/Review
Parent Publication: Journal of Materials Science: Materials in Electronics
Issue: 18