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The origin of negative charging in amorphous Al2O3 films: the role of native defects. (2019)

First Author: Dicks OA

Attributed to: Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/ab0450

PubMed Identifier: 30716723

Publication URI: http://europepmc.org/abstract/MED/30716723

Type: Journal Article/Review

Volume: 30

Parent Publication: Nanotechnology

Issue: 20

ISSN: 0957-4484