Structural characterization of porous GaN distributed Bragg reflectors using x-ray diffraction (2019)

First Author: Griffin P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5134143

Publication URI: http://dx.doi.org/10.1063/1.5134143

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 21