Direct measurement of TEM lamella thickness in FIB-SEM. (2020)

First Author: Conlan AP
Attributed to:  Next Generation Multi-Dimensional X-Ray Imaging funded by EPSRC


No abstract provided

Bibliographic Information

Digital Object Identifier:

PubMed Identifier: 31823368

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Type: Journal Article/Review

Volume: 279

Parent Publication: Journal of microscopy

Issue: 3

ISSN: 0022-2720