Submicrometer Resolution Hyperspectral Quantum Rod Thermal Imaging of Microelectronic Devices (2019)
Attributed to:
Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsaelm.9b00575
Publication URI: http://dx.doi.org/10.1021/acsaelm.9b00575
Type: Journal Article/Review
Parent Publication: ACS Applied Electronic Materials
Issue: 1