Deep Learning Supersampled Scanning Transmission Electron Microscopy (2019)

First Author: Ede Jeffrey M.
Attributed to:  Application of novel computing and data analysis methods in electron microscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1910.10467

Publication URI: http://dx.doi.org/10.48550/arxiv.1910.10467

Type: Journal Article/Review

Parent Publication: arXiv e-prints