475F9336-C249-4BD2-BE3F-3714192090BFApplication of novel computing and data analysis methods in electron microscopyStudentship1917382798CB33D-C79E-4578-83F2-72606407192CEPSRCINCOME_ACTUAL0D05C2B87-EEE9-496B-83C6-1E4F73AAEA0EAutoencoders, Kernels, and Multilayer Perceptrons for Electron Micrograph Restoration and CompressionarXiv e-prints13f6baa6cee4363ebd60e66880540c74Ede Jeffrey M.2018-01-01http://dx.doi.org/10.48550/arxiv.1808.09916http://dx.doi.org/10.48550/arxiv.1808.09916Journal Article/Review5e314cd8a5eed3.77302000