Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning (2020)

First Author: Ede Jeffrey M.
Attributed to:  Application of novel computing and data analysis methods in electron microscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2001.10938

Publication URI: http://dx.doi.org/10.48550/arxiv.2001.10938

Type: Journal Article/Review

Parent Publication: arXiv e-prints