Improving EBSD precision by orientation refinement with full pattern matching. (2020)

First Author: Winkelmann A
Attributed to:  Quantitative non-destructive nanoscale characterisation of advanced materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12870

PubMed Identifier: 31997348

Publication URI: http://europepmc.org/abstract/MED/31997348

Type: Journal Article/Review

Volume: 277

Parent Publication: Journal of microscopy

Issue: 2

ISSN: 0022-2720