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Quantification of atomic force microscopy tip and sample thermal contact. (2019)

First Author: Umatova Z

Attributed to: Scanning thermal conduction microscopy with dual cantilever resistive probe funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5097862

PubMed Identifier: 31575264

Publication URI: http://europepmc.org/abstract/MED/31575264

Type: Journal Article/Review

Volume: 90

Parent Publication: The Review of scientific instruments

Issue: 9

ISSN: 0034-6748