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Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films (2019)

First Author: Trager-Cowan C

Attributed to: Nanoanalysis for Advanced Materials and Healthcare funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/prj.7.000b73

Publication URI: http://dx.doi.org/10.1364/prj.7.000b73

Type: Journal Article/Review

Parent Publication: Photonics Research

Issue: 11