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LF-OCT Based Non-Destructive Testing for IGBT Module (2018)

First Author: Zhao Z

Attributed to: Underpinning Power Electronics 2012: Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/wipdaasia.2018.8734660

Publication URI: http://dx.doi.org/10.1109/wipdaasia.2018.8734660

Type: Conference/Paper/Proceeding/Abstract