LF-OCT Based Non-Destructive Testing for IGBT Module (2018)
Attributed to:
Underpinning Power Electronics 2012: Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/wipdaasia.2018.8734660
Publication URI: http://dx.doi.org/10.1109/wipdaasia.2018.8734660
Type: Conference/Paper/Proceeding/Abstract