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Gate Oxide Electrical Stability of p-type Diamond MOS Capacitors (2018)

First Author: Loto O

Attributed to: Q-NEURO: Diamond Quantum Technology for the Investigation of Neurological disease funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2018.2847340

Publication URI: http://dx.doi.org/10.1109/ted.2018.2847340

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 8