Gate Oxide Electrical Stability of p-type Diamond MOS Capacitors (2018)
Attributed to:
Q-NEURO: Diamond Quantum Technology for the Investigation of Neurological disease
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2018.2847340
Publication URI: http://dx.doi.org/10.1109/ted.2018.2847340
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 8