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Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars (2011)

First Author: Korte S

Attributed to: An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2011.08.022

Publication URI: http://dx.doi.org/10.1016/j.actamat.2011.08.022

Type: Journal Article/Review

Parent Publication: Acta Materialia

Issue: 19