Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars (2011)
Attributed to:
An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2011.08.022
Publication URI: http://dx.doi.org/10.1016/j.actamat.2011.08.022
Type: Journal Article/Review
Parent Publication: Acta Materialia
Issue: 19