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RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2RRAM switching operation and failure mechanism (2016)

First Author: Chai Z

Attributed to: Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/vlsit.2016.7573402

Publication URI: http://dx.doi.org/10.1109/vlsit.2016.7573402

Type: Conference/Paper/Proceeding/Abstract